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Abstract A novel miniature Mach-Zehnder (MZ) interferometer is proposed. The micro-machined MZ interferometer is fabricated on an SOI wafer using Deep Reactive Ion Etching (DRIE) technology. The new structure is based on the use of two Si/Air beam splitters, and two metallic mirrors fabricated monolithically in a small footprint measuring 1 mm x 2 mm on the die. By moving the mirrors using an integrated comb drive MEMS actuator, the structure is tested to perform the function of a Fourier Transform Infrared (FT-IR) spectrometer, where two wavelengths 1550 nm and 1575 nm have been successfully identified showing a spectral resolution of 25 nm. White Source measurements have been also done on the MZ spectrometer; however, the results were affected by the dispersion in silicon. A solution for such dispersion problem is proposed and presented in this thesis. The successful implementation of this four element interferometer in an integrated form opens the door for the development of more complex optical structures that are self aligned and fabricated in a one step lithography process. |