الفهرس 
CHAPTER 1: INTRODUCTIONOnly 14 pages are availabe for public view
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Abstract
No attempt have deen made to correlate the structural information about Pbs thin films with their electric and optical properties. On the other hand, althoigh Pbs was used for many years as IR-photo-conductivity, it is not enough studied from the point of view of solar selectivity. Therefore, an extensive study intercorrelates the structural characteristics and electrical properties is required. Such study together with an optical one is essential to investigat Pbs film for solar selectivity. In the present work structural, and solar selective properties of Pbs thin film were studied.
Structural characteristics of Pbs films were achived using line profile analysis of x-ray diffraction patterns. A Fortran computer program was written for instrumental correction of x-ray diffraction patterns by Fourier line-shape analysis according to Stokes method. For grain size and microstrain calculations warren and Averbach method was used. The electrice properties were measured using four point proper van der pauw method. Ohmic behavior was achieved by using indium contact. Transmission and reflection were determined spectroscopically in the wave length range from 300-900nm. from these data the solar selective properties were extracted.
In a series of tests, the thickness was the changing parameter while the deposition rate was kept constant. A rate of 2nm/min and substrate temperatures of 100, 150 and 180c◦ were used during the deposition of films with thickness from 14 to 140nm in steps of 14nm. Thickness monitor readings were calibrated against interferometically determined film thickness.