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العنوان
Intercorrelation of Structural Characteristics and Critical Properties of High Temperature Superconductor Thin Films /
المؤلف
Abdel-Hamed, Mohamed Osman.
هيئة الاعداد
باحث / Mohamed Osman Abdel-Hamed
مشرف / Ch. Heiden
مشرف / A. A. Ramadan
مشرف / R. W?rdenweber
مشرف / S. K. Abdel-Raheem
الموضوع
Thin films. High temperature superconductors. Epitaxy.
تاريخ النشر
1993.
عدد الصفحات
114 p. :
اللغة
الإنجليزية
الدرجة
الدكتوراه
التخصص
الفيزياء وعلم الفلك
تاريخ الإجازة
1/1/1993
مكان الإجازة
جامعة المنيا - كلية العلوم - Department of Physics
الفهرس
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Abstract

A Superconductor thin film applications such as microelectornics require a high quality films. the judgment that the film has high quality is that the film is epiaxial grown, has high transition temperature, Tc, and a strong uppercritical fied , Bc2, as wall as large critical current density , Jc, .to achieve haigh critical properties the flux lines should be pinned by the interaction with the defects in the film.